Changes for version 0.03 - 2021-10-22
- CHANGES
- Added a --best-effort mode where failures are presumed temporary
- Added optional middle-of-3 filtering to reduce spurious sensor noise
- Added a prometheus exporter script using Metrics::Any and Net::Prometheus
- BUGFIXES
- Correct handling of undef unit names
- Correct handling of undef reading values
Documentation
commandline test utility for Device::Chip sensor data
write CSV files from Device::Chip sensor data
Modules
Base class to build Device::Chip::Sensor-based applications on